Sensor

ABSTRACT

A sensor comprising a light component in support of a light source operable to direct a beam of light onto an imaging device having an image sensor, such as a CCD or CMOS or N-type metal-oxide-semiconductor (NMOS or Live MOS) sensor. The sensor can also comprise an imaging device positioned proximate to the light component and operable to receive the beam of light, and to convert this into an electric signal, wherein the light component and the imaging device are movable relative to one another, and wherein relative movement of the light component and the imaging device is determinable in multiple degrees of freedom. The sensor can also comprise a light deflecting module designed to deflect light from a light component onto the imaging device. The light sources and the resulting beams of light therefrom can comprise a number of different types, orientations, configurations to facilitate different measurable and determinable degrees of freedom by the sensor.

CROSS REFERENCE TO RELATED APPLICATION

This application is a continuation of U.S. patent application Ser. No.15/852,013 filed on Dec. 22, 2017 and a Continuation of U.S. patentapplication Ser. No. 14/690,352 filed on Apr. 17, 2015 now U.S. Pat. No.9,851,196 issued on Apr. 17, 2015.

BACKGROUND

Sensors are used in a wide range of applications and are adapted tomeasure a wide variety of quantities. Many sensors can determine adesired quantity using a displacement measurement, such as a positionsensor, a strain gage, a load cell, an accelerometer, an inertialmeasurement unit, a pressure gage, etc.

BRIEF DESCRIPTION OF THE DRAWINGS

Features and advantages of the invention will be apparent from thedetailed description which follows, taken in conjunction with theaccompanying drawings, which together illustrate, by way of example,features of the invention; and, wherein:

FIG. 1 is a side schematic view of a sensor in accordance with anembodiment of the present disclosure.

FIG. 2 is a top schematic view of the sensor of FIG. 1.

FIG. 3A illustrates a side schematic view of a light source of a sensorin accordance with an embodiment of the present disclosure.

FIG. 3B illustrates a side schematic view of a light source of a sensorin accordance with another embodiment of the present disclosure.

FIG. 3C illustrates a side schematic view of a light source of a sensorin accordance with another embodiment of the present disclosure.

FIG. 4 is a top schematic view of the sensor of FIG. 1 undergoingrelative movement of a light component and an imaging component in twotranslational degrees of freedom (along the x and y axes), in accordancewith an embodiment of the present disclosure.

FIG. 5 is a side schematic view of the sensor of FIG. 1 undergoingrelative movement of a light component and an imaging component in atranslational degree of freedom along a z axis.

FIG. 6A is a side schematic view of the sensor of FIG. 1 undergoingrelative movement of a light component and an imaging component in arotational degree of freedom, in accordance with another embodiment ofthe present disclosure.

FIG. 6B is a side schematic view of the sensor of FIG. 1 undergoingrelative movement of a light component and an imaging component in arotational degree of freedom, in accordance with yet another embodimentof the present disclosure.

FIG. 6C is a side schematic view of the sensor of FIG. 1 undergoingrelative movement of a light component and an imaging component in arotational degree of freedom, in accordance with yet another embodimentof the present disclosure.

FIG. 7 is a top schematic view of the sensor of FIG. 1, illustratingdifferent configurations of light beams in accordance with variousexamples of the present disclosure.

FIGS. 8A-8D illustrate different cross-sectional shapes of light beamsincident on an image sensor of an imaging device.

FIG. 9 is a side schematic view of a sensor in accordance with yetanother embodiment of the present disclosure.

FIG. 10 is a side schematic view of a sensor in accordance with yetanother embodiment of the present disclosure.

FIG. 11 is a side schematic view of a sensor in accordance with stillanother embodiment of the present disclosure.

FIG. 12 is a side schematic view of a sensor in accordance with stillanother embodiment of the present disclosure.

FIG. 13 is a side schematic view of a sensor in accordance with stillanother embodiment of the present disclosure.

FIG. 14 is a side schematic view of a sensor in accordance with stillanother embodiment of the present disclosure.

FIG. 15 illustrates a top schematic view of a sensor in accordance withanother embodiment of the present disclosure.

FIGS. 16A and 16B illustrate representations of light emissions asapplied to the imaging device from a light source within a sensor inaccordance with one example of the present disclosure.

FIG. 16C illustrates a graphical representation of a light emissionhaving an interference wave pattern about the imaging device resultingfrom impinging beams of light from two or more light sources.

FIG. 17 a schematic of a plurality of sensors configured to worktogether to expand the capabilities beyond a single sensor.

FIGS. 18A-18D illustrate various examples of systems and methods whereinthe sensor technology discussed herein can be applied.

FIG. 19A illustrates a side schematic view of a sensor in accordancewith another example of the present disclosure.

FIG. 19B illustrates a bottom view of the sensor of FIG. 19A taken alongsection A-A, representing a fiducial in accordance with one example.

FIG. 19C illustrates a bottom view of the sensor of FIG. 19A taken alongsection A-A, representing a fiducial in accordance with another example.

FIG. 20A illustrates a side schematic view of a sensor in accordancewith still another example of the present disclosure.

FIG. 20B illustrates a bottom view of the sensor of FIG. 20A taken alongsection A-A, representing a fiducial in accordance with one example

Reference will now be made to the exemplary embodiments illustrated, andspecific language will be used herein to describe the same. It willnevertheless be understood that no limitation of the scope of theinvention is thereby intended.

DETAILED DESCRIPTION

As used herein, the term “substantially” refers to the complete ornearly complete extent or degree of an action, characteristic, property,state, structure, item, or result. For example, an object that is“substantially” enclosed would mean that the object is either completelyenclosed or nearly completely enclosed. The exact allowable degree ofdeviation from absolute completeness may in some cases depend on thespecific context. However, generally speaking the nearness of completionwill be so as to have the same overall result as if absolute and totalcompletion were obtained. The use of “substantially” is equallyapplicable when used in a negative connotation to refer to the completeor near complete lack of an action, characteristic, property, state,structure, item, or result.

As used herein, “adjacent” refers to the proximity of two structures orelements. Particularly, elements that are identified as being “adjacent”may be either abutting or connected. Such elements may also be near orclose to each other without necessarily contacting each other. The exactdegree of proximity may in some cases depend on the specific context.

An initial overview of technology embodiments is provided below and thenspecific technology embodiments are described in further detail later.This initial summary is intended to aid readers in understanding thetechnology more quickly but is not intended to identify key features oressential features of the technology nor is it intended to limit thescope of the claimed subject matter.

Although typical sensors are generally effective for a given purpose,they often have substantially different resolutions in one or moredegrees of freedom. There is often one preferred degree of freedom thatpossesses substantially greater resolution than one or more of the otherdegrees of freedom. Additionally, obtaining measurement redundancyand/or measurements in multiple degrees of freedom can significantlyincrease size, complexity, and/or cost, which can preclude usingredundant or multiple degree of freedom sensors in some applications.Thus, redundant sensors or multiple degree of freedom sensors wouldlikely be more readily utilized in the event they were able to providesize, complexity, and/or cost within practical limits, such as thoseapproximating single degree of freedom sensors.

Accordingly, a sensor is disclosed that can provide for redundancyand/or measurement in multiple degrees of freedom without significantlyincreasing size, complexity, or cost. In one aspect, the sensor can beadapted to measure any given quantity that can be determined using adisplacement measurement. The sensor can comprise a light component insupport of a light source operable to direct a beam of light; an imagingdevice positioned proximate to the light component and operable toreceive the beam of light, and to convert this into an electric signal,wherein the light component and the imaging device are movable relativeto one another, wherein relative movement of the light component and theimaging device is determinable in multiple degrees of freedom. In someexamples, the light source can comprise a single light source operableto generate a single beam of light in six degrees of freedom. Additionallight sources can be included that are each configured to generateadditional beams of light.

In another aspect, the present disclosure describes a sensor comprisingat least one light source operable to direct a beam of light; an imagingdevice operable to receive the beam of light, and to convert the beam oflight into an electric signal; a light deflection module proximate theimaging device operable to receive the beam of light and to deflect thebeam of light onto the imaging device, wherein the light deflectionmodule and the imaging device are movable relative to one another;wherein relative movement of the light deflection module and the imagingdevice is determinable in multiple degrees of freedom.

In still another aspect, the present disclosure describes a sensorcomprising a light component in support of at least one light sourceoperable to emit a beam of light; an imaging device operable to receivethe beam of light, and to convert the beam of light into at least oneelectric signal; a light location module configured to receive the atleast one electric signal and determine a location of the beam of lighton the imaging device; and a position module configured to determine arelative position of the imaging device and the light component based onthe location of the beam of light on the imaging device, wherein thebeam of light comprises an annular configuration having at least twoedges at the imaging device, such that more than one light distributionexists about the imaging device, the imaging device converting the lightinto multiple electric signals.

In still another example, a sensor can comprise a support structure; animaging device positioned proximate the support structure, the supportstructure and the imaging device being movable relative to one anotherin at least one degree of freedom; a fiducial disposed about the supportstructure and operative to define, at least in part, an image havingimage indicia identifiable by the imaging device, wherein a signalgenerated by the imaging device is based substantially on the fiducial,and wherein an aspect of the fiducial relative to the imaging device iscaused to change with the relative movement of the support structure andthe imaging device; and a position module configured to determine arelative position of the imaging device and the support structure basedon the position of the fiducial relative to the imaging device.

In still another example, a sensor system can comprise an object to besensed; a sensor disposed about the object, the sensor comprising animaging device positioned proximate to a surface of at least a portionof the object, the object and the imaging device being movable relativeto one another in at least one degree of freedom; and a fiducialdisposed about the surface of the object and identifiable by the imagingdevice, wherein an aspect of the fiducial relative to the imaging deviceis caused to change with the relative movement of the support structureand the imaging device, and wherein the sensor is actuatable uponrelative movement between the object and the imaging device tofacilitate determination of the change in the aspect of the fiducial.

The present disclosure further describes a method for facilitating adisplacement measurement, comprising providing a light component insupport of a light source operable to direct a beam of light; providingan imaging device positioned proximate to the light component andoperable to receive the beam of light, and to convert this into anelectric signal, wherein the light component and the imaging device aremovable relative to one another; and facilitating relative movement ofthe imaging device and the light component.

The present disclosure still further describes a method for facilitatinga displacement measurement, comprising providing at least one lightsource operable to direct a beam of light; providing an imaging deviceoperable to receive the beam of light, and to convert the beam of lightinto an electric signal; providing a light deflecting module proximatethe imaging device operable to receive the beam of light and to deflectthe beam of light onto the imaging device, wherein the light deflectingmodule and the imaging device are movable relative to one another,wherein relative movement of the light deflecting module and the imagingdevice is determinable in multiple degrees of freedom.

One example of a sensor 100 is illustrated schematically in FIGS. 1 and2 and 4-8. The sensor 100 can comprise an imaging device 110. Theimaging device 110 can comprise or otherwise be operable with an imagesensor 111, such as a pixel sensor, photo sensor, or any other suitabletype of imager that can convert light into electrical signals. In oneaspect, the imaging device 110 can comprise an active pixel sensorhaving an integrated circuit containing an array of pixel sensors,wherein each pixel contains a photodetector and an active amplifier.Circuitry next to each photodetector can convert the light energy to avoltage. Additional circuitry may be included to convert the voltage todigital data. One example of an active pixel or image sensor is acomplementary metal oxide semiconductor (CMOS) image sensor. In anotheraspect, the image device 110 can comprise a charge-coupled device (CCD)image sensor. In a CCD image sensor, pixels can be represented byp-doped MOS capacitors. These capacitors are biased above the thresholdfor inversion when light acquisition begins, allowing the conversion ofincoming photons into electron charges at a semiconductor-oxideinterface. The CCD is then used to read out these charges. Additionalcircuitry can convert the voltage into digital information. In stillanother aspect, the image device 110 can comprise a N-typemetal-oxide-semiconductor (NMOS or Live MOS) type image sensor. Theimaging device 110 can therefore include any suitable device or sensorthat is operable to capture light and convert it into electricalsignals, such as an imaging sensor typically found in digital cameras,cell phones, web cams, etc.

The sensor 100 can also include a light component 120 in support of oneor more light sources operable to direct beams of light respectively. Inthe example illustrated, the light component comprises a single lightsource 121 that operates to deliver a single light beam or beam of light123. The light source 121 can comprises an LED, a laser, an organic LED,a field emission display element, a surface-conduction electron-emitterdisplay unit, a quantum dot, a cell containing an electrically chargedionized gas, a fluorescent lamp, a hole through which light from alarger light source located external to the plane of light emission canpass, and/or any other suitable light source. FIG. 3A illustrates a lens227 operable with a light source 221 to focus or direct light from thelight source 221 into a suitable beam of light 223, in this case acolumnar shaped beam of light. FIG. 3B illustrates a collimator 328operable with a light source 321 to “narrow” light from the light source321 into a suitable beam of light 323, also in this case a columnar beamof light. It is noted that a collimator can be used with any of theexample sensors discussed herein to generate beams of light having othercross-sectional shapes. FIG. 3C illustrates a collimator 428 operablewith a light source 421 to provide a beam of light having a nonuniformor tapering shape (e.g., conical) about its longitudinal axis. It shouldbe recognized that a lens and a collimator can be used alone or in anycombination with a light source to achieve a suitable beam of light.

The imaging device 110 can be positioned proximate the light component120 and operable to directly receive the beam of light 123 and convertthis into one or more electric signals. A light location module 130 canbe configured to receive the electric signals and determine the variouslocations of the beam of light 123 on the imaging device 110. Forexample, pixels of the imaging device 110 can be individually addressedsuch that the light intensity on each individual pixel may be known ordetermined by the light location module 130.

The imaging device 110 and the light component 120 can be movablerelative to one another in one or more degrees of freedom, and aboutdifferent axes. Thus, a position module 140 can be configured todetermine a relative position of the imaging device 110 and the lightcomponent 120 based on the various locations of the beam of light 123 onthe imaging device 110, such as movement from an initial or firstposition to one or more subsequent positions (e.g., position 2, 3, 4, .. . n). It is noted herein that the imaging device 110 and the lightcomponent 120 being movable relative to one another can comprisearrangements in which a) the light component is movable relative to afixed imaging device, b) the imaging device is movable relative to afixed light component, c) a movable imaging device and a movable lightcomponent. It is intended to be understood that any construction of theclaims to ascertain their meaning is to include such arrangements. Thesame is true for any other components or devices identified herein asbeing movable relative to one another, such as the light deflectionmodule described below.

In one aspect, the imaging device 110 and the light component 120 can becoupled 112 to one another in a manner that facilitates relativemovement. For example, the light component 120 can be “fixed” and theimaging device 110 can be supported about the light component 120 by astructure, device, or mechanism that can facilitate movement of theimaging device 110 relative to the light component 120. It should berecognized that in some embodiments the imaging device 110 can be“fixed” and the light component 120 movable relative thereto. Theimaging device 110 and the light component 120 can be constrained forrelative movement only in one or more selected degrees of freedom, suchas translation in the X axis or rotation about the Z axis, etc. Anysuitable arrangement of the imaging device 110 and the light component120 is contemplated that facilitates relative movement of the imagingdevice 110 and the light component 120 in one or more desired degrees offreedom.

Relative movement of the imaging device 110 and the light component 120can facilitate measurement of such relative movement, for example as arelative displacement and/or a rotation. Accordingly, a sensor inaccordance with the present disclosure can be operable to measure orsense any quantity that can be based on, or that can be derived from, arelative movement, such as displacement, rotation, velocity,acceleration, etc. For example, a sensor as described herein canfunction as a position sensor, a strain gage, an accelerometer, a loadsensor, or any other type of sensor that can utilize a relative motionto mechanically and/or computationally provide a measurement of adesired type. In one aspect, therefore, the sensor 100 can also includea clock 150 to measure elapsed time associated with a relative movement,as may be useful for determining velocity, acceleration, or otherdynamic measurement quantities.

In addition, because the individual addresses of the pixels are known,the sensor 100 can be considered an “absolute” sensor. This attributeallows the sensor 100 to be powered off when not needed (i.e., toconserve energy) and powered on again to take a measurement or readingwithout needing to be initialized or otherwise calibrated to determinethe relative position of the imaging device 110 and the light component120.

The imaging device 110 can comprise a pixel array of any suitable size,dimension, aspect ratio, and/or pixel count. For example, the pixelarray can be a one-dimensional array or a two-dimensional array, such asan array of pixels arranged in rows and columns. In one aspect, a rangeof motion of the sensor can be limited by the size of the imagingdevice, although multiple imaging devices can be disposed adjacent toone another to provide a greater range of motion for the sensor. Inanother aspect, a range of motion of the sensor can be impacted by thelocation and/or size of the light sources. Thus, light sources can belocated and/or sized to accommodate the desired relative movementsbetween the light component and the imaging device. It should berecognized that a sensor in accordance with the present disclosure canalso be configured to produce substantially the same level of resolutionin each degree of freedom.

In one aspect, a center location of the beam of light 123 on the imagingdevice 110 can be determined utilizing a statistical method applied tothe location of the beam of light 123 on the imaging device 110. Suchcomputations can be performed by the position module 140. For example,the beam of light 123 can be distributed across multiple pixels on theimaging device 110 and can exhibit an intensity gradient that can beanalyzed using statistical methods to determine the center of the beam.

In another aspect, the imaging device 110 can be monochromatic orchromatic and the light source 121 can produce any suitable color oflight, such as white, red, green, or blue. The color selectivity ofchromatic pixels to specific light beam wavelengths can be utilized toeffectively increase pixel populations, which can be used to determinethe location of the center of the beam without degradation from aneighboring light beam on the imaging device. For example, three lightsources (red, green, and blue) can be used in close proximity to oneanother with a chromatic imaging device in place of a single lightsource with a monochromatic imaging device to determine a relativemovement of the light component 120 and the imaging device 110 withoutinterference from one another. The chromatic imaging device can track orsense different color light beams separately, even though the lightbeams may overlap on the imaging device. Different parts of the imagingdevice corresponding to different colors can generate separate signalsthat can be used to determine the relative movement of the light sourceand the imaging device, such as by providing redundancy and/oradditional data points for computation.

Thus, in one aspect, the imaging device can comprise a color separationmechanism 160. Any suitable color separation mechanism can be used, suchas a Bayer sensor in which a color filter array passes red, green, orblue light to selected pixel sensors, a Foveon X3 sensor in which anarray of layered pixel sensors separate light via the inherentwavelength-dependent absorption property of silicon, such that everylocation senses all three color channels, or a 3CCD sensor that hasthree discrete image sensors, with the color separation done by adichroic prism.

It is noted that although many concepts and details pertaining to thepresent technology are discussed with respect to the sensor 100, theseconcepts and details are also applicable to the other sensors discussedherein. Indeed, the present disclosure is intended to incorporate theseinto the various embodiments discussed herein and to the sensortechnology in general, where appropriate and where apparent to thoseskilled in the art.

FIGS. 4-8, with continued reference to FIGS. 1 and 2, illustrate thesensor 100 in which relative movement between the imaging device 110 andthe light component 120 is represented, and the various degrees offreedom in which the sensor is capable of measuring the relativemovement. The single light source 121 produces the single light beam 123that can be referred to generally as a “perpendicular” light beam, inthat the light beam 123 (or a longitudinal axis of the light beam 123)is perpendicular or substantially perpendicular to the imaging device110 in a normal or nominal relative orientation of the imaging device110 and the light component 120, the light beam 123 comprising alongitudinal axis 104. As will be discussed below, the light beam cancomprise various cross-sectional shapes, configurations or shapes alongits longitudinal axis, etc., which can be generated or produced in avariety of ways.

In general, the single light source can be used to determine relativemovement of the light component and the imaging device in multipledegrees of freedom depending upon the configuration of the variouscomponents making up the sensor. In some cases, depending upon theconfiguration of the light source and/or the beam of light, up to sixdegrees of freedom may be achieved, such as three translation degrees offreedom in the x, y and z directions, and three rotation degrees offreedom about the x, y and z axes. In any of these cases, the sensor canbe caused to operate utilizing less than a total available number ofdegrees of freedom, such as may be called for in differentcircumstances.

As shown in FIGS. 4 and 5 for example, the single light source 121,which directs the single light beam 123 substantially perpendicular tothe X and Y translational degrees of freedom, can be used to determinerelative movement of the imaging device 110 and the light component 120in these two translational degrees of freedom. Movement of the lightbeam 123, as caused by the relative movement between the light component120 and the imaging device 110, can trace a path 125 a along the imagesensor of the imaging device 110 as these components move relative toone another from an initial or first position to a second position.

The beam of light 123, as generated by the light source 121, cancomprise different types or shapes. In one aspect, the beam of light 123can comprise a columnar or cylindrical configuration (see FIG. 1) alonga longitudinal axis of the beam of light and between the light source121 and the imaging device 110. In another aspect, the beam of light 123can comprise a nonuniform or tapering configuration along itslongitudinal axis (e.g., conical) and between the light source and theimaging device 110 (see FIG. 5). In the columnar configuration, littleor no measurements due to translation in the Z direction, or along the Zaxis, will be readable as there will be no change in pixel illuminationas a result of the movement (although the intensity of the light canchange and be measureable). On the other hand, if the beam of light 123is caused to have a conical or tapering shape (when viewed laterallyalong the x and/or y axes) relative movement of the imaging device 110and the light component 120 in a Z direction or translational degree offreedom is determinable. For example (as shown in FIG. 5), as theimaging device 110 and the light component 120 move relative to oneanother, such as the imaging device moving away from the light component120 in the direction 102 along the z-axis from a first position to asecond position (the imaging device 110 being shown in dotted lines inthe more distant, second position), the beam of light 123 can be causedto illuminate an area A2 (at the second position) on the imaging device110 larger in size than an area A1 (at the first or initial, closerposition) due to the increase in the size of the cross-sectional area ofthe cone at the terminus of the beam of light 123 about the imagingdevice 110, thus making translational movement along the z-axisdeterminable. It is noted that measurement along the z axis is alsodeterminable in the direction opposite that shown by direction 102,where the area illuminated on the imaging device 110 decreases as theimaging device 110 approaches the light component 120 (going from areaA2 to A1). Pixels along the path 125 a (FIG. 4) and within the areas A1and A2 (FIG. 5) can be used to determine, at least partially, relativemotion of the imaging device 110 and the light component 120 in thethree identifiable degrees of freedom discussed above. Based on this,all three translational degrees of freedom can be achieved if the sensoris appropriately configured.

As shown in FIGS. 6A-C, and 7, and with further reference to FIGS. 1 and2, the imaging device 110 and the light component 120 can be movablerelative to one another in one or more rotational degrees of freedom,wherein such relative movement can be determinable to provide additionalmeasureable degrees of freedom, still while utilizing only a singlelight source 121. In the examples shown, the imaging device 110 and thelight component can be configured to be rotatable relative to oneanother about any combination of the X, Y and Z axes, and depending uponthe configuration of the sensor, rotational degree of freedom can bedeterminable in addition to the translational degrees of freedomdiscussed above. For example, relative rotation of the imaging device110 and the light component 120 about the X axis can provide measurementin a first rotational degree of freedom. Relative rotation along the Xaxis causes the beam of light 123 to disperse across additional ordifferent areas of the imaging device 110 as the imaging device 110rotates from a first position parallel to the light component 120 to asecond position non-parallel to the light component 120. Similarly,relative rotation of the imaging device 110 and the light component 120about the Y axis can provide measurement in a second rotational degreeof freedom. Rotation along the Y axis also causes the beam of light 123to disperse across additional areas of the imaging device 110.

FIGS. 6A-6C illustrate further use of the single light beam 123 indetermining relative movement of the imaging device 110 and the lightcomponent 120 in a rotational degree of freedom, in this case about theX axis.

Although not specifically shown, similar determinable measurements canbe made from relative rotation of the imaging device 110 and the lightcomponent 120 about the Y axis. FIGS. 6A-6C illustrate the imagingdevice 110 in a second position after rotation about the X axis indirections 106 a-c, respectively, from an initial, first positionparallel with the light component 120. The light beam 123 can bedirected substantially perpendicular to the axis of the rotationaldegree of freedom. As shown in FIG. 6A, the imaging device 110 is shownrotated in direction 106 a relative to the light component 120. The axisor center of rotation 107 a is located about the X axis, and intersectsa longitudinal axis 104 of the light beam 123. In this example,determinable measurements and resolution of the sensor 100 will depend,at least in part, upon the area of the light beam 123 about the imagingdevice 110 and the degree of relative rotation between the imagingdevice 110 and the light component 120. For example, if the light beam123 comprises a columnar or conical shape, and the rotation of theimaging device 110 is limited to that shown in FIG. 6A, the light beam123 could be caused to disperse across an additional or different areaof the imaging device 110 as the cross-sectional area of the light beam123 on the imaging device 110 changed from circular to oval. As such,this additional or different dispersed area can provide a determinablemeasurement along the X axis, thus giving the sensor an additionalmeasurable rotational degree of freedom.

As shown in FIG. 6B, the imaging device 110 is shown rotated indirection 106 b relative to the light component 120 from an initialposition parallel with the light component 120. The axis of rotation 107b is located in a position offset from the longitudinal axis 104 of thelight beam 123. In this configuration, light beam 123 moves in direction105 along the imaging device 110 upon the rotation of the imaging device110 in direction 106 b, and in addition the cross-sectional area of thelight beam changes (e.g., from circular to oval), thus causing the lightbeam 123 to disperse across additional or different areas of the imagingdevice 110. This dispersing of the light beam 123 across additional ordifferent areas of the imaging device 110 can be used to determine thatthe imaging device 110 rotated relative to the light component 120 indirection 106 a about a center of rotation 107 a, thus providing thesensor 100 with an additional measurable rotational degree of freedom.

As shown in FIG. 6C, the imaging device 110 is shown rotated indirection 106 c relative to the light component 120 from an initialposition parallel with the light component 120. The axis of rotation 107c is located in a position offset from the longitudinal axis 104 of thelight beam 123, which is on the other side of the light beam 123 ascompared to that shown in FIG. 6B. In this configuration, light beam 123moves in direction 109 along the imaging device 110 upon the rotation ofthe imaging device 110 in direction 106 b, and in addition thecross-sectional area of the light beam 123 changes (e.g., from circularto oval). As such, the light beam 123 is caused to disperse acrossadditional or different areas of the imaging device 110. This dispersingof the light beam 123 across additional or different areas of theimaging device 110 can be used to determine that the imaging device 110rotated relative to the light component 120 in direction 106 a about thecenter of rotation 107 a, thus providing the sensor 100 with anadditional measurable rotational degree of freedom. So far, this givesthe sensor 100 five degrees of freedom.

In each of the examples of FIGS. 6A-6C, interrogation of the imagingdevice 110 and the signals created by the light beam 123 on the imagingdevice, can be used to determine that the imaging device 110 rotatedrelative to the light component 120 about the X axis. The relativerotation of the imaging device 110 and the light component 120 about theY axis is not shown, but is similar in result to that for relativerotation about the X axis with the sensor configured as shown.

Relative rotational movement of the imaging device 110 and the lightcomponent 120 about the Z axis to obtain or provide a sixth determinabledegree of freedom for the sensor 100 can be achieved in multiple wayswith the single light source 121. In one aspect, the single light source121 can be configured to, or can be operable with another structure, toemit a light beam 123 having a cross-sectional shape or area with adimension in a first direction greater than a dimension in a different,second direction transverse to the first direction. For example, thebeam of light 123 can comprise a length greater than a width. The firstand second directions can be along axes intersecting through a centerpoint of the cross-sectional shape. In another aspect, the single lightsource 121 can be configured to, or can be operable with anotherstructure, to emit a light beam 123 having a cross-sectional shapehaving a dimension in one direction greater than a dimension in a seconddirection. In still another aspect, the single light source 121 can beconfigured to, or can be operable with another structure, to emit alight beam 123 having a cross-sectional shape defined by any shapeconfigured to disperse light on additional or different areas of theimaging device 110 upon rotation about the Z axis and a center pointlocated anywhere within the boundaries of the cross-sectional shape.

No matter how generated, by employing a beam of light having this typeof shape, relative rotational movement between the imaging device 110and the light component 120 along the Z axis will cause the light beamto disperse across additional or different pixels of the imaging device110, thus providing a determinable rotational degree of freedom aboutthe Z axis, and thus facilitating achievement of a sixth degree offreedom by the sensor 100 using a single light source and a single beamof light. These conditions or parameters can generally be described as alight beam having an oblong configuration, but this is not meant to belimiting in any way as the word oblong may not accurately describe allof the available or possible cross-sectional shapes the beam of lightcould comprise. Such a shape of light can be obtained by configuring alight source with such a configuration. Alternatively, the light sourcecan emit light having any shape (e.g., a non-oblong (e.g., columnar)shape), yet be directed through a suitably shaped hole or aperture (or asuitable collimator) such that the light emitted from the aperturecomprises the desired (e.g., oblong) shape.

FIG. 7 illustrates one example of the sensor 100 comprising a singlelight source 121 configured to emit a light beam 123 a comprising acircular cross-section, and to rotate about a point offset from a centerpoint of the light beam 123. In this example, rotation of the imagingdevice about the Z axis and about center of rotation 101 will notregister a measurement. In other words, no rotational degree of freedomabout the Z axis is obtained as the light beam 123 a is not caused todisperse across additional or different areas of the imaging device 110upon relative rotation of the imaging device 110 and the light component120. However, relative rotation about the center point 101′ offset fromthe light beam 123 a will cause the offset light beam 123 a to trace apath 125 across the imaging device 110. Pixels along the path 125 of thelight beam 123 a can be interrogated to determine the relative motion ofthe imaging device 110 and the light component 120 about the Z axis. Itis noted that as the rotation axis or center point 101′ approaches theaxis of the light beam 123 a, the sensitivity of the sensor decreases asthe imaging device is unable to detect as easily changes across theimaging device. Coincident rotation with the axis of the light beam 123a, as noted above does not yield a rotational measurement about the zaxis. As such, a light beam having an oblong cross-sectional shape (orother similar cross-sectional configuration or shape) can be utilized toprovide measurement about the Z axis as the oblong shape will have alength greater than a width or height, and thus will facilitate lightdispersal across different or additional areas of the imaging device 110upon relative rotation. It is noted herein that rotation of the imagingdevice 110 about center point 101 is not specifically shown. However,one skilled in the art will recognize the various possible relativepositions of the imaging device and the light component upon rotationabout such point.

On the other hand, FIG. 7 also illustrates an alternative light beamconfiguration, wherein the cross-sectional shape of the light beam 123 bcomprises a length dimension greater than a width dimension, which shapein this particular example comprises an oval. Indeed, relative rotationof the imaging device 110 and the light component 120 about the centerpoints 101 will cause the light beam 123 b to disperse across additionalor different areas of the imaging device 110, as shown. This can be seenby the oval shaped light beam 123 represented in dotted lines in itsinitial position, and solid lines in its rotated position, wherein thelight beam 123 b disperses light across additional or different areas ofthe imaging device 110. Likewise, relative rotation of the imagingdevice 110 and the light component 120 about the center points 101′ willcause the light beam 123 b to disperse across additional or differentareas of the imaging device 110 as it is caused to trace path 125.

It should be recognized that a sensor in accordance with the presentdisclosure can have multiple translational degrees of freedom and/ormultiple rotational degrees of freedom. Additional light sources, overthe single light source 121 of sensor 100, may help improve resolutionof the sensor, in that there is more light movement across the imagingdevice and therefore more pixels to interrogate to obtain data that canbe utilized to determine the relative movement of the imaging device andthe light component. Depending upon the configuration of the sensor andthe interrogation system, additional light sources may also allow forsimplified calculation algorithms.

FIGS. 8A-8D illustrate different exemplary non-circular light beams 123a-d, respectively, having cross-sectional areas or shapes configured tofacilitate determination of a rotational degree of freedom about the Zaxis. FIG. 8A illustrates a light beam 123 a having a rectangularcross-sectional shape, in which a length dimension is greater than awidth dimension along respective axes intersecting at a center point.FIG. 8B illustrates a light beam 123 b having an oval cross-sectionalshape, in which a length dimension is greater than a width dimensionalong respective axes intersecting at a center point. FIG. 8Cillustrates a light beam 123 c having a triangular cross-sectionalshape, in which a width dimension is greater than a length dimensionalong respective axes intersecting at a center point. FIG. 8Aillustrates a light beam 123 d in the form of a line, in which a lengthdimension is greater than a width dimension along respective axesintersecting at a center point. Of course, those cross-sectional shapesillustrated in the figures and described herein are not intended to belimiting in any way. Those skilled in the art will recognize othercross-sectional shapes exist that are capable of dispersing light acrossdifferent areas of the imaging device 110 upon rotation about the Zaxis.

FIG. 9 illustrates a sensor in accordance with another example of thepresent disclosure. In this example, the sensor 200 can be similar tothe sensor 100 described above, which description is incorporated herewhere appropriate and as recognized by those skilled in the art. Thesensor 200 can comprises an imaging device 210. The imaging device 210can comprise or otherwise be operable with an image sensor 211, such asa pixel sensor, photo sensor, or any other suitable type of imager thatcan convert light into electrical signals. The sensor 200 can alsoinclude a first light component 220 a in support of one or more lightsources operable to direct beams of light respectively. The first lightcomponent 220 a and the imaging device 210 can be parallel to oneanother and configured to be moveable relative to one another in one ormore degrees of freedom. For example, the first light component 220 acan support a single light source 221 a that operates to deliver a lightbeam or beam of light 223 a onto the imaging device 210. Othercomponents and functions of the sensor 100 discussed above, can also beimplemented or incorporated into the sensor 200 as will be apparent tothose skilled in the art. However, unlike the sensor 100 discussedabove, the sensor 200 can be further or alternatively be configured suchthat the light source 221 a is mounted on the light component 220 a in away (e.g., the light source 221 a is mounted on an incline relative tothe light component 220 a) so as to direct the beam of light 223 a ontothe imaging device 210 at an incline, wherein the beam of light 223 ahas a longitudinal axis oriented on an incline relative to the imagingdevice 210, such that an angle of incidence of the beam of light 223 ais on an incline relative to the imaging device 210.

The sensor 200 can alternatively comprise, or comprise in addition tothe first light source 221 a, a second light component 220 b in supportof a second light source 221 b. In some aspects, the second lightcomponent 220 b can be mounted or otherwise situated or disposed orlocated on the same side of the imaging device 210. In one aspect, thesecond light component 220 b can be fixed relative to the imaging device210, wherein the second light component 220 b and the first lightcomponent 220 a are movable relative to one another. The second lightsource 221 b can be configured to direct a beam of light 223 b onto thesurface 225 of the first light component 120 b, wherein the first lightcomponent 120 b is configured to and capable of redirecting, reflecting,deflecting, etc. all or a portion of the beam of light 223 b off of oneof its surfaces, for example surface 225 toward, and onto the imagingdevice 210, and specifically the image sensor 211, and wherein theimaging device can convert the second beam of light to an electricsignal receivable by the light location module in a similar manner asthe first beam of light 223 a. Likewise, the position module can beconfigured to determine a relative position of the imaging device andthe light component based on the location of the first beam of light 223a and the second beam of light 223 b on the imaging device 210. In oneaspect, the surface 225 can be made of a reflective or semi-reflectivematerial. In another aspect, the surface 225 can be coated with acoating facilitating all or partial reflection or deflection of the beamof light 223 b. Examples of suitable materials can include, but are notlimited to a metalized surface, a metalized surface configured to beresistant to oxidation, although this is not required. Some specificexamples may include sputtered gold, platinum, palladium, aluminum,titanium, chromium, cobalt, magnesium, stainless steel, nickel, etc.Examples, of metals that could be used, but that could oxidize over timecan include silver, iron, steel, tungsten, etc. The sputtering describedabove can be replaced with the application of foils or shim stock usingany of the above-referenced materials. In other aspects, mirrored glass,mirrored polymers, etc. In other aspects, Mylar, a reflective polymer,or other polymers made with metal fillers could provide a reflectivefunction. In the event that there is any scattering introduced by thesematerials, such artifacts can be corrected out since they would notpossess the intensity of the primary light source. Surface 225 can beconfigured in other way as will be recognized by one skilled in the artwhere all or partial deflection/reflection of the beam of light 223 boff of the first light component 220 a and onto the imaging device 210is facilitated.

Similar to the other embodiments discussed herein, the sensor 200 can beconfigured to function as a sensor by virtue of the relative movementbetween the first light component 220 a, the second light component 220b and the imaging device 210. In one aspect, with the first light source221 a configured to direct an angled beam of light 223 a onto theimaging device 210 and the image sensor 211, relative translationalmovement between the imaging device 210 and the first light component220 a along each of the x, y and z axes is measureable and determinableas movement in each of these directions will cause light to disperseacross different portions of the image sensor 211 from an initialposition. Furthermore, relative rotational movement between the imagingdevice 210 and the first light component 220 a about each of the x, yand z axes is measureable and determinable as movement in each of thesedirections will also cause light to disperse across different portionsof the image sensor 211 from an initial position. As such, with thesensor 200 configured as shown, the sensor 200 is capable of sensingmeasurements in six degrees of freedom. To be sure, rotation about the zaxis is obtained by providing the beam of light 223 a on an anglerelative to the image sensor 211. This can cause the beam of light 223 ato project or emit an oblong shaped beam onto the surface of the imagesensor 211, such that upon rotation about the z axis, other pixels arecaused to receive light, thus providing a determinable measurement.Another variable that goes along with the size of the oblong shaped beamis the intensity of the beam of light. The intensity dissipates as thelight source and the imaging device move away from one another, so eachof these variables are usable alone or in combination.

In another aspect, with the second light component 220 b and the secondlight source 221 b configured to direct a beam of light 223 b onto thesurface 225 of the first light component 220 a and subsequently onto theimaging device 210 and the image sensor 211 as reflected (or otherwisedeflected) from the surface 225 of the first light component 220 a, andwith the second light component 220 b fixed relative to the imagingdevice 210, relative translational movement between the imaging device210 and the second light component 220 b along the z axis is measureableand determinable. In this configuration, translational movement alongthe x and y axes is not measureable as the second light component 220 band the imaging device 210 are fixed relative to one another, andmovement by the second light component 220 b along either of the x and yaxes would not cause additional or other pixels on the image sensor 211to be illuminated. Of course, it is contemplated that in another aspect,the sensor 200 can be configured such that the second light component220 b and the imaging device 210 are moveable relative to one another,which would provide determinable measurements from translationalmovement along each of the x, y and z axes.

Furthermore, in the situation where the second light component 220 b isfixed relative to the imaging device 210, but that the imaging device210 and the first light component 220 a are moveable relative to oneanother, relative rotational movement between these components about thex and y axes is determinable. Rotation about the z axis will likely notyield a determinable measurement in this situation as the rotation ofthe first light component 220 a about the z axis will not cause thereflected beam of light 223 b to emit across other pixels. However, inthe configuration in which the second light component 220 b and theimaging device 210 are moveable relative to one another, relativerotational movement about each of the x, y and z axes is measurable anddeterminable.

Of course, each of the first and second light components 220 a and 220 bcan be used in combination in a single sensor 200, with these beingfixed or movable relative to one another and the imaging device 210 assuits a particular application. Moreover, those skilled in the art willrecognize that any number of first and/or second light sources 221 a and221 b can be used within the sensor 200.

In one aspect, the imaging device 210 and the first and second lightcomponents 220 a and 220 b can be coupled 212 to one another in a mannerthat facilitates relative movement between any combination of them.Likewise, the second light component 220 b and the imaging device 210can be supported within the sensor 200 such that they are fixed relativeto one another.

The sensor 200 can further comprise a light location module 230, aposition module 240 and a clock 250 in a similar manner as discussedabove. Similarly, interrogation and function of the sensor 200 can beaccomplished in a similar was as described elsewhere herein.

FIG. 10 illustrates a sensor in accordance with another example of thepresent disclosure. In this example, the sensor 300 comprises a lightcomponent 320 in support of a light source 321, which is mounted in asubstantially normal orientation on the light component, and which isconfigured to emit a beam of light 323 onto an image sensor of animaging device 310 initially supported in a manner such that it isoriented on an angle relative to the light component 320 (e.g., they arenon-parallel to one another). In the configuration shown, the sensor 300is capable of providing determinable translational measurements alongthe x and y axes, and determinable rotational measurements about the xand y axes. Translational and/or rotational measurements can bedeterminable in the event a conical and/or an oblong (or other similarshaped) beam of light is caused to be emitted onto the imaging device310.

With reference to FIG. 11, illustrated is a sensor 400 in accordancewith another example of the present disclosure. The sensor 400 issimilar in many respects to the other sensors described herein. As such,the description of the various components or elements of those sensorsare incorporated herein as appropriate and as will be apparent to thoseskilled in the art. Unlike the sensor embodiments previously discussed,the sensor 400 comprises a light deflection module 424 positioned aboutan imaging device 410 having an image sensor 411. The light deflectionmodule 424 can comprise a surface 425 configured to partially reflect,fully reflect or otherwise deflect light emitted onto it from a lightsource. In the example shown, the sensor can further comprise a lightcomponent 420 a in support of a light source 421 a operative to emit abeam of light 423 a onto the reflective surface 425 of the lightdeflection module 424. In one aspect, the light component 420 a islocated on a common side as the imaging device 410, and operates tosupport the light source 421 a in such a manner so as to direct the beamof light 423 a in a direction initially away from the imaging device 410and toward the reflective surface 425 of the light deflecting module424. It is noted that being located on a common side, the light source421 a and the imaging device 410 can both be powered from the same sidein one example sensor configuration. Upon coming into contact with thereflective surface 425 of the light deflecting module 424, thereflective surface 425 operates to reflect, partially reflect orotherwise deflect the emitted light in a different direction, causing itto be emitted onto the image sensor 411 of the imaging device 410 asshown. The light component 420 a and light source 421 a are shown asbeing fixed relative to the imaging device 410. In addition, the lightcomponent 420 a and the light deflecting module 424 can be configured tobe moveable relative to one another, such that relative movement causesthe emitted light to disperse across additional pixels as the movementof the imaging device 410 and the light component 420 a deviate from aninitial position. In one aspect, the light deflection module 424 canfacilitate specular reflection and can comprise a planar surface 425 andcan be positioned, initially, substantially parallel to the lightcomponent 420 a, such that the angle of incidence in the beam of light423 a emitted from the light source 421 a is the same as the angle ofthe reflected beam of light off of the surface 425 and onto the imagesensor 411. In another aspect, the light deflection module 424 canfacilitate specular reflection and can comprise a planar surface 425 andcan be oriented such that two or more of the x-y-z axes of the lightdeflection module are non-parallel to the imaging device. In stillanother aspect, the light deflection module 424 can comprise a nonplanarsurface (e.g., such as one having a rough surface, a surface with one ormore irregularities, etc.) such that the angle of incidence of theemitted beam of light 423 a on the nonplanar surface is different fromthe angle of reflection of the reflected beam of light as directed uponthe image sensor 411.

The sensor 400 can further comprise a second light component 420 b insupport of a light source 421 b operative to emit a beam of light 423 btoward the light deflection module 424 and onto the reflective surface425, wherein the beam of light is reflected onto the image sensor 411 ofthe imaging device 410. The second light component 420 b and secondlight source 421 b can be positioned about the imaging device 410 in asimilar position and manner as the first light component 420 a and firstlight source 421 a (e.g., in substantially the same plane as the imagingdevice 410, on an opposing side of the imaging device 410, etc.), or itcan be positioned in a different position (e.g., in a different planethan the first light component 420 a). A second light component 420 bcan improve or enhance resolution of the sensor 400, depending upon howthe sensor 400 is configured.

Similar to other sensors described herein, the sensor 400 can beconfigured to function as a sensor by virtue of the relative movementbetween the first light component 420 a, the second light component 420b and the imaging device 410. In operation, relative movement betweenthe imaging device 410 and the light deflecting module 424 canfacilitate measurements in multiple degrees of freedom similar to othersensors discussed herein. In the embodiment shown, for example, relativetranslational movement can be determinable along the z axis as the angleof incidence and the angle of reflection change as the light deflectingmodule 424 moves toward and away from the imaging device 410. With thefirst light component 420 a and the first light source 421 a configuredto direct a beam of light 423 a onto the surface 425 of the lightdeflecting module 424 and subsequently onto the imaging device 410 andthe image sensor 411 as reflected (or otherwise deflected) from thesurface 425, and with the first light component 420 a and first lightsource 421 a fixed relative to the imaging device 410, relativetranslational movement between the imaging device 410 and the firstlight component 420 a along the z axis is measureable and determinable.In this configuration, translational movement along the x and y axes isnot measureable as the first light component 420 a and the imagingdevice 410 and first light source 421 a are fixed relative to oneanother, and movement by the first light component 420 a along either ofthe x and y axes would not cause additional or other pixels on the imagesensor 411 to be illuminated. Of course, it is contemplated that inanother aspect, the sensor 400 can be configured such that the firstlight component 420 a and the imaging device 410 are moveable relativeto one another, which would provide determinable measurements fromtranslational movement along each of the x, y and z axes.

With respect to rotational measurements within the sensor 400, in thesituation where the first light component 420 a and first light source421 a are fixed relative to the imaging device 410, relative rotationalmovement between these components about the x and y axes isdeterminable. Rotation about the z axis will likely not yield adeterminable measurement in this situation as the rotation of the firstlight component 420 a about the z axis will not cause the reflected beamof light 423 a to emit across other pixels. However, in theconfiguration in which the first light component 420 a and the imagingdevice 410 are moveable relative to one another, relative rotationalmovement about each of the x, y and z axes is measurable anddeterminable.

Although the first and second light components 420 a and 420 b (andtheir associated light sources) are shown as being fixed relative to theimaging device 410, this is not to be limiting in any way. Indeed, insome aspects, the sensor 400 can be configured such that one or both ofthe first and second light components 420 a and 420 b and the imagingdevice 410 are moveable relative to one another.

The sensor 400 can further be operative with a light location module430, a position module 440 and a clock 450 in a similar manner asdiscussed above. Similarly, interrogation and function of the sensor 400can be accomplished in a similar way as described elsewhere herein.

With reference to FIG. 12, illustrated is a sensor 500 in accordancewith another example of the present disclosure. The sensor 500 issimilar in many respects to the sensor 400 discussed above, except thatthe light deflecting module 524 (which is shown as being planar) withits associated surface 525 is initially oriented on an incline relativeto the image sensor 511 and the imaging device 510 about one of the xand y axes (in this case the x axis, as shown). In this embodiment, withthe light component 520 fixed relative to the imaging device 510,relative translational movement between the light deflecting module 524and the imaging device 510 is measurable and determinable along the yand z axes. Furthermore, relative rotational movement between the lightdeflecting module 524 and the imaging device 510 is measureable anddeterminable about each of the x, y and z axes. In essence, it iscontemplated that the sensor 500 can be initially oriented such that atleast two of the x-y-z axes of the light deflection module arenon-parallel to the imaging device, thus facilitating the determinationof the relative movement of the imaging device and the light deflectionmodule in at least five degrees of freedom.

With reference to FIG. 13, illustrated is a sensor 600 in accordancewith another example of the present disclosure. The sensor 600 issimilar in many respects to the sensors 400 and 500 discussed above,except that the light deflecting module 624 (which is shown as beingplanar) with its associated surface 625 is initially oriented on anincline relative to the image sensor 611 and the imaging device 610about each of the x and y axes. In this embodiment, with the lightcomponent 620 fixed relative to the imaging device 610, relativetranslational movement between the light deflecting module 624 and theimaging device 610 is measurable and determinable along each of the x, yand z axes. Furthermore, relative rotational movement between the lightdeflecting module 624 and the imaging device 610 is measureable anddeterminable about each of the x, y and z axes. Here, it is contemplatedthat the sensor 600 can be oriented such that all three of the x-y-zaxes of the light deflection module are non-parallel to the imagingdevice, wherein relative movement of the imaging device and the lightdeflection module is determinable in six degrees of freedom.

The sensor 600 can further comprise a light deflecting module comprisingtwo surfaces 625 and 626 extending in or oriented in two differentplanes. In the example shown, the surface 625 can be offset from thesurface 626 any desired or needed angle. Providing multiple surfaces canenhance the sensitivity of the sensor 600 by providing some relativemovements between the imaging device and the light deflecting module 624that are measurable at a faster rate and/or with more accuracy. Forexample, a change in the angle of reflection is likely to occur muchfaster and at a much larger degree if the beam of light 623 travelsacross both of surfaces 625 and 626 during a measurable relativedisplacement or movement within the sensor 600.

The light deflecting module 624 can be operative with (e.g., coupled,joined to, adhered to, etc., such as via a coupling mechanism, device,system 612) to the imaging device 610 in a manner so as to facilitaterelative movement between the two as discussed herein. Likewise, thelight component 620 can be operative with (e.g., coupled to, joined to,adhered to, etc., such as via a coupling mechanism, device, system 613)the light deflecting module 624 so as to facilitate relative movementbetween the two as discussed herein. Alternatively, the light component620 can be operative with the imaging device 610 in a similar manner.Furthermore, the sensor 600 can be operative with a light locationmodule 630, a position module 640 and a clock 650 in a similar manner asdiscussed above. Similarly, interrogation and function of the sensor 600can be accomplished in a similar way as described herein

With reference to FIG. 14, illustrated is a sensor 700 in accordancewith another example of the present disclosure. The sensor 700 issimilar in many respects to the sensors 400, 500 and 600 discussed abovein that the sensor 700 comprises a light deflecting module 724 operativeto deflect (e.g., reflect) light 723 emitted from the light source 721supported by the light component 720 toward the imaging device 710 andonto the image sensor 711. However, in this example, the lightdeflecting module 724 is non-planar and comprises a correspondingsurface 725. In this example, the light deflecting module 724 and thesurface 725 are shown as having a curved configuration. The surface 725can be curved in multiple directions, such as comprising a partialarcuate or partial spherical shape. It is noted that the curved lightdeflecting module 724 shown in the drawings is intended to berepresentative of one example embodiment. Indeed, those skilled in theart will recognize other configurations that are possible. With thelight deflecting module 724 comprising a curved configuration, relativemovement between the imaging device 710 and the light deflecting module724 is measurable and determinable within six degrees of freedom (threetranslational degrees of freedom along the x, y and z axes, and threerotational degrees of freedom about the x, y and z axes). Indeed,relative movement between these components will cause the beam of light723 to disperse across additional or other pixels as compared to thosereceiving light initially.

It is noted that one advantage of providing a light source on a commonor same side as the imaging device, and being able to deflect or reflectthis light off of a light deflecting module onto the image sensor 711,is that power can be supplied to the sensor and all of its components inneed of power (i.e., the light source, the imaging device) from the sameside.

The light deflecting module 724 can be operative with (e.g., coupled,joined to, adhered to, etc., such as via a coupling mechanism, device,system 712) to the imaging device 710 in a manner so as to facilitaterelative movement between the two as discussed herein. Likewise, thelight component 720 can be operative with (e.g., coupled to, joined to,adhered to, etc., such as via a coupling mechanism, device, system 713)the light deflecting module 724 so as to facilitate relative movementbetween the two as discussed herein. Alternatively, the light component720 can be operative with the imaging device 710 in a similar manner.Furthermore, the sensor 700 can be operative with a light locationmodule 730, a position module 740 and a clock 750 in a similar manner asdiscussed above. Similarly, interrogation and function of the sensor 700can be accomplished in a similar way as described herein.

FIG. 15 illustrates a sensor in accordance with another example of thepresent disclosure. In this example, the sensor 800 can be formed andcan be caused to function similar to the other sensor examples discussedherein. For example, the sensor 800 can comprise one or more lightcomponents in support of at least one light source operable to emit oneor more beams of light; an imaging device 810 operable to receive thebeams of light, and to convert these into at least one electric signal;a light location module configured to receive the at least one electricsignal and determine the locations of the one or more beams of light onthe imaging device; and a position module configured to determine arelative position of the imaging device and the light component based onthe locations of the one or more beams of light on the imaging device810.

However, sensor 800 can comprise multiple beams of light, with one ormore of these beams of light formed having a ring or ring-likeconfiguration, and one or more comprising a central beam of light.Moreover, the multiple beams of light can be configured such that therecomprises unlit or “dark” areas or areas of reduced illuminationadjacent and/or between the beams of light, thus providing the beams oflight with at least one edge. For example, in the embodiment shown, thesensor comprises two beams of light from one or multiple light sources.The first beam of light 823 a comprises a central beam of light. Formedin a ring around the central first beam of light 823 a is a second beamof light 823 b. The at least two edges of the beam of light 823 b at theimaging device can define outer and inner perimeters of an annular ring,wherein an area of reduced illumination can be adjacent the annularring. Indeed, the second beam of light 823 b can be separated from thefirst beam of light 823 a by an area of reduced illumination 822 (anarea about the imaging device that is unlit (or dark) or partially unlit(or dark)), which in this case also comprises an annular ringconfiguration surrounding the central first beam of light 823 a.

The first and second beams of light 823 a and 823 b can be spaced at anydistance. Moreover, the second beam of light 823 b and the area ofreduced illumination 822 can comprise the same or different widthswithin themselves, and relative to one another. They can even comprisecolor to help in distinguishing them or certain characteristics of them.

The first and second beams of light 823 a and 823 b can be generated andemitted by any light component/light source number, type, etc. discussedherein, and that would be apparent to those skilled in the art. In oneaspect, the beams of light 823 a and 823 b can be generated by a singlelight source, such as light source 821, operative with a lens or lenssystem configured to provide a sequential pattern or array of a centralfirst beam of light, an area of reduced illumination, and a ring orsurrounding second beam of light. The lens can be configured to generateany desired pattern, shape, sequence, etc. of light in accordance withthe discussion herein. The light source can be configured to direct aseries of beams of light onto the imaging device, with each beam oflight at the imaging device having at least two edges.

In another aspect, the beams of light 823 a and 823 b can be generatedby a single light source, such as light source 821, operative with anoptical blocker configured to provide or generate the annular beams oflight and adjacent areas of reduced illumination. In still anotheraspect, multiple light sources can be used to generate the various beamsof light and areas of reduced illumination. Still other devices andsystems and methods may be available to generate the various beams oflight and adjacent areas of reduced illumination as will be apparent tothose skilled in the art.

It is noted that any type of light component/light source discussedherein can be utilized in the sensor to create the light rings. Inaddition, those skilled in the art will recognize that the rings do nothave to be circular or annular, but that they can comprise anyconfiguration or shape. Moreover, the light distribution across theimaging device can comprise any sequence or pattern of both lit andnon-lit areas, wherein the non-lit areas may comprise dark areas orareas of reduced illumination (e.g., adjacent the annular rings). Thelight sources can further be configured to emit light at a given colorfrequency.

Providing the sensor with and configuring the beams of light in thistype of configuration functions to increase the number of edges of thebeams of light, which improves the resolution of the sensor. Resolutionis increased as additional distributions of light between edges are madeavailable for interrogation along different axes of movement. Inaddition, the edges can provide a highly discernible location for thepresence or non-presence of light, and thus leading to increasedstatistical robustness in the post-processing steps.

FIG. 16A illustrates a representation of one exemplary pattern ofannular beams of light and adjacent areas of reduced illumination(surrounding a central beam of light). In this example, a central beamof light is surrounded by an annular area of reduced illumination, whichis surrounded by an annular beam of light. This light/reduced light ordark pattern can repeat as often as needed or required across theimaging device 810 a to provide or define several edges.

FIG. 16B illustrates a representation of a light emission pattern basedon light generated from multiple light sources, each one comprising apattern of annular beams of light and adjacent areas of reducedillumination (surrounding a central beam of light). In this example,there are a total of four different light/reduced light or dark patternsdistributed across the imaging device 810 b, each one with a pluralityof edges.

The present disclosure further describes a sensor configured to providelight emitted by two or more light sources in accordance with yetanother example. Again, the sensor can be formed and can be caused tofunction similar to the other sensor examples discussed herein. Forexample, the sensor can comprise one or more light components in supportof, in this case, at least two light sources operable to emit respectivebeams of light; an imaging device operable to receive the beams oflight, and to convert these into at least one electric signal; a lightlocation module configured to receive the at least one electric signaland determine the locations of the one or more beams of light on theimaging device; and a position module configured to determine a relativeposition of the imaging device and the light component based on thelocations of the one or more beams of light on the imaging device.However, unlike the sensors discussed above, the sensor can comprise aplurality of light sources supported by one or more light componentsoperative to generate the beams of light, such that these interfere withone another to create a plurality of light (where light is dispersed)and reduced light (where a reduced amount or no light is dispersed)areas about the imaging device. More specifically, at least some of theplurality of light sources can be configured to emit light at the sameor different frequencies. The light sources can be configured and/ororiented such that their light emissions (or waves) impinge one another,such that a cumulative, interference light emission having a pluralityof edges is caused to be received on or at the imaging device. Upongenerating an interference light emission, one or more identifiableresultant superposed light wave front patterns (with edge detail formingvarious light areas and areas of reduced illumination adjacent oneanother) will emerge or be present on the imaging device havingconstructive and/or destructive wave properties. FIG. 16C illustrates arepresentation of this, wherein two light sources generate twoindividual light emissions 823 c and 823 c′ that are shown as impingingone another, thus resulting in a cumulative interference light emission827 having constructive wave forms or a constructive wave pattern aboutthe imaging device 810 c. The interference light emission and theresultant wave front patterns can provide a large number of lightdistributions available for detection and interrogation by the lightlocation module and the position module operable with the sensor andsensor system due to the interference light emission present on theimaging device. In one example, the sensor can be configured such thatthe interference light emission comprises a plurality of lightdistributions, wherein the number of light distributions is greater innumber than the number of light sources used to generate the beams oflight. This increase in available light distributions can function toincrease the resolution of the sensor over other sensors discussedherein. Relative movement between the imaging device and the lightcomponents (or the light deflecting modules) will cause the interferencelight emission to disperse across a larger number of different pixels ofthe imaging device. Which movement will result in signals and data to beidentified and interrogated in a similar manner as with other sensorsdiscussed herein, except that in this embodiment, there are several morelight distributions. It is further noted that the light sources can emitlight of the same or different color as well, thus providing stilladditional data for processing.

It is noted herein that each of the various light sources discussedabove in the various embodiments and examples can be oriented in avariety of ways and directions. For example, angled light sources(relative to the imaging device) can be oriented to direct light beamsin planes parallel to degree of freedom axes.

It is also noted that the number, location and placement, orientation,type, etc. of the light components and the light sources relative to theimaging device can be whatever is needed or desired to ensure that norelative movement of the imaging device and light component can “trick”the sensor into a faulty or incorrect reading and to achieve a desiredresult, such as redundancy or level of resolution. Those shown in thefigures are merely exemplary, and are not intended to be limiting in anyway. For example, light sources can be placed so as to emit light ontoperiphery portions, inner portions of the image sensor of the imagingdevice, or a combination of these. In one aspect, the number placementand type of light sources utilized can be configured to maximize the“sweep” of the light across the imaging device during relative movementof the light components and the imaging device within the sensor. Lightsources can also be arranged in groups or patterns to provide differentpatterns or clusters of light onto the imaging device. Furthermore,colored light sources and a color separation mechanism can also beemployed to fit an increased number of light sources into a small areawithout degrading the performance of the sensor.

FIG. 17 illustrates another embodiment of a sensor 900 that can includemultiple light sources 921 a-c as well as multiple imaging devices 910a-f disposed adjacent to one another to provide continuous measurementover a larger range of motion that may not available using only a singleimaging device. For example, the sensor 900 can include any of thefeatures and elements described hereinabove, such as a light component920 in support of the light sources 921 a-c (which may be perpendicularand/or angled) that direct light beams 923 a-c, respectively, toward oneor more of the imaging devices 910 a-f or a light deflecting module at agiven time. As shown, the imaging devices 910 a-f are arranged in astaggered configuration with a region 914 in between imaging deviceswhere no image sensor is present, such as at an interface betweenadjacent imaging devices. A light beam 923 a may terminate at a location929 a that is in the region 914 between adjacent imaging devices 910 a,910 b, in which case the light beam 923 a will not contribute to theposition determining functionality of the sensor 900. However, in thiscase, light beams 923 b, 923 c can terminate at locations 929 b, 929 con imaging devices 910 b, 910 e, respectively, to contribute to theposition determining functionality of the sensor 900 even when the lightbeam 923 a cannot. In other words, the other imaging devices 910 b, 910e still receiving light beams 923 b, 923 c, respectively, can compensatefor the loss of signal from any given light source, such as 921 a. Inone aspect, the number and/or arrangement of imaging devices and/orlight sources can be configured to ensure that at least one light sourcewill terminate on an imaging device throughout a desired range of motionof the sensor and in any degree of freedom of the sensor Thus, in thisway, multiple light sources can be used to ensure that the sensor 900 isoperable to determine relative position of the light component 920 andthe imaging devices 910 a-f even when a light source is directing a beamof light to an area that is without an image sensor.

With reference to FIGS. 18A and 18B, illustrated are two additionalexemplary sensors in accordance with the present disclosure. Forexample, FIG. 18A illustrates a sensor 1000 having an elastic member1070, 1071 coupled to the imaging device 1010 and the light component1020 to facilitate relative movement of the imaging device 1010 and thelight component 1020. The elastic member 1070, 1071 can establish anominal relative position for the imaging device 1010 and the lightcomponent 1020 and can facilitate relative movement of the imagingdevice 1010 and the light component 1020 in any suitable degree offreedom. The elastic member 1070, 1071 can comprise a spring, which canbe configured as any suitable metal spring or as an elastomeric spring.Thus, in one aspect, the elastic member 1070, 1071 can act as a polymersuspension system for the imaging device 1010 and the light component1020.

In one aspect, the elastic member 1070, 1071 can be disposed outboard ofthe light sources 1021, 1022. In another aspect, the elastic member cancomprise a transparent layer disposed between the imaging device 1010and the light component 1020. In one embodiment, the elastic member cancomprise a silicone layer that acts as a separator between the imagingdevice 1010 and the light component 1020, which may provide a lowdisplacement and high resolution sensor. In one aspect, the range ofmotion for the sensor 1000 can be limited by the size of the imagingdevice 1010 and the type of suspension or separation structure, whichcan depend on the magnitude of the desired range of motion and/or theapplication of the particular sensor.

For example, one application for the sensor 1000 can be as a straingage. In this case, the imaging device 1010 can be anchored to a surface1013 at location 1014 and the light component can be anchored to thesurface 1013 at location 1015. As the surface 1013 experiences strain,the imaging device 1010 and the light component 1020 will move relativeto one another, which movement can serve to facilitate measurement ofthe strain in one or more degrees of freedom.

In a similar alternative sensor design, illustrated in FIG. 18B, the1100 can comprise a light deflecting module 1124 designed to reflectlight off of its surface onto the imaging device 1110. The sensor 1110can further comprise a light component 1120 positioned on a common sideas the imaging device 1110, wherein the light component 1120 supports alight source 1121 configured to direct a beam of light toward the lightdeflecting module 1124 for subsequent reflecting of the beam of lightonto the imaging device 1110. The light component 1120 can be located inthe same plane as the imaging device 1110, and coupled to the elasticmember 1170 and the imaging device 1110. The elastic member 1171 can becoupled to the imaging device 1110 as previously discussed. FIG. 18Billustrates a light source 1122 supported about the light deflectingmodule 1124. In an alternative design, the light reflecting module 1124could be replaced with a light component as shown in FIG. 18A, whereinthe light component is modified with a reflective surface (e.g., acoating) to facilitate reflection of the beam of light from the lightsource 1121. Similar to the sensor 1000 discussed above, the lightcomponent 1120 (and indirectly the imaging device 1110) of the sensor1100 can be anchored to a surface 1113 at location 1114 and the lightdeflecting module 1124 can be anchored to the surface 1113 at location1115. It will be recognized by those skilled in the art that a straingauge is merely one example type of sensor made possible by thetechnology discussed herein. As such, this particular application is notintended to be limiting in any way.

FIG. 18C illustrates another example of a sensor 1200 having a mass 1280associated with the light component 1220, which can enable the sensor1200 to measure acceleration and/or function as a navigation aid. Themass 1280 and the light component 1220 can be supported by an elasticmember 1270, such as a spring, to facilitate relative movement of theimaging device 1210 and the light component 1220 in one or more degreesof freedom. In one aspect, the elastic member 1270 can be coupled to asupport structure 1290, which can be coupled to the imaging device 1210.Although the light component 1220 is shown in the figure as beingassociated with the mass 1280 and suspended by the elastic member 1270,it should be recognized that the imaging device 1210 can be associatedwith the mass 1280 and suspended by the elastic member 1270.Alternatively, as shown in FIG. 18D, a light deflecting module 1324 canbe associated with the mass 1380 and elastic member 1370, and the lightcomponent 1320 in support of a light source can be located on a commonside with the imaging device 1310. The elastic member 1370 can becoupled to the support structure 1390, which can be coupled to the lightcomponent 1320 (and indirectly to the imaging device 1310).

In another example of a sensor (not shown), a whisker can be coupled toan imaging device or a light component and placed in a flow field todetermine boundary layer thickness. In yet another example of a sensor(not shown), an imaging sensor and a light component can be configuredfor continuous relative rotation to measure rotary position.

With reference to FIGS. 19A and 19B, illustrated is a sensor inaccordance with another example of the present disclosure. The sensor1400 comprises an imaging device 1410 having an image sensor 1411 and asupport structure 1440, wherein the imaging device is positionedproximate the support structure 1440. The support structure 1440 and theimaging device can be moveable relative to one another in one or moredegrees of freedom (e.g., translational and/or rotational degrees offreedom as discussed herein with other sensors). The sensor furthercomprises a fiducial 1448 disposed about the support structure 1440, inthis example about the surface 1445 of the support structure 1440. Thefiducial 1448 can comprise anything that can be identified by theimaging device 1410, wherein a characteristic or aspect of the fiducial(e.g., all or part of a size of the fiducial, a position of the fiducialrelative to the imaging device, a color of the fiducial, an intensity ofthe fiducial, etc.) is determinable upon the relative movement of theimaging device 1410 and the fiducial 1448, one or more of thesecharacteristics or aspects effectively changing due to the relativemovement. In the example shown, the fiducial comprises an object havinga cross shape that is supported on the support structure 1440, and thatcomprises identifiable dimensions operative to provide or facilitate animage detectable by the imaging device 1410. The sensor 1400 can beoperable within ambient light conditions, meaning that it is somewhatdifferent from other sensors discussed herein that describe and utilizea beam of light that is used for measurements that is caused to beemitted from a light source dedicated for that purpose. Here, in thisexample, the sensor 1400 is operable in ambient light (light that isdispersive and not necessarily directional in nature or suppliedspecifically for the purpose of facilitating operation of the sensor),wherein the ambient light illuminates the fiducial such that thefiducial is viewable by the imaging device under the ambient light. Theambient light 1421 can comprise natural light (e.g., the sun) orartificial light (powered light). Although the ambient light 1421 isshown in the example of FIG. 19A as being above the imaging device, thisis not to be limiting in any way. The source of the ambient light can belocated anywhere relative to the sensor. The intensity of the ambientlight should be such that the fiducial 1448 and the associated imageindicia are detectable.

The image that is detected or seen by the imaging device 1410, as basedon the presence of the fiducial 1448, can have some image indicia, suchas a patter or spectra or levels of contrast or brightness, whether forone or more colors (or black or white), intensities of one or morecolors (or black or white) and/or whether in one or both dimensions ofthe imaging device 1410 (i.e., X or Y, or some or all of X+Y). At anygiven starting point of the fiducial 1448 relative to the imaging device1410, that starting point can be made the “zero” and then used as thereference for determining the relative movement of the imaging device1410 and the support structure 1440, and the fiducial 1448. Indetermining a measurement, the end point of the fiducial 1448 can becompared to the starting point and the distance the fiducial 1448traveled about the imaging device 1410 can provide a measurement. Forexample, the starting point or “zero” can be known. Upon relativemovement between the imaging device 1410 and the support structure andthe fiducial 1448, the second or end point of the fiducial 1448 relativeto the imaging device 1410 will be offset from the starting point. Basedon the distance and direction traveled by the fiducial, or the change inposition, various measurements can be determined to facilitate operationof the sensor as intended. In short, a starting image with its imagefiducials can be compared to a subsequent image with its image fiducialsand these compared to obtain the desired measurements.

In one aspect, one or more characteristics or aspects of the fiducial1448 can be known beforehand. For example, the various dimensions of thefiducial 1448 can be known and stored in a memory operative with theposition module and wherein a change in size of the fiducial 1448 isdeterminable upon relative movement of the support structure 1440 andthe imaging device 1410 in a given degree of freedom, and comparison ofthe change in size of the fiducial 1448 to the actual size of thefiducial 1440 provides a determinable degree of relative movementbetween the support structure 1440 and the imaging device 1410.

In another aspect, a dimension of the fiducial 1448 along a first axiscan be different than a dimension of the fiducial 1448 along a secondaxis (see dotted lines in FIG. 17 where in one example the length of thefiducial along the X axis can be greater than the length of the fiducialalong the Y axis), thus facilitating measurements about a z-axis uponrelative movement of the support structure 1440 and the imaging device1410.

Up to three translational degrees of freedom along the X, Y and Z axescan be obtained and up to three rotational degrees of freedom about theX, Y and Z axes can be obtained by comparing the position of thefiducial 1448 relative to the imaging device 1410. For example,translation along the X and Y axes can be obtained by measuring thechange in position of the fiducial relative to the imaging device 1410.The path of travel can also be identifiable and determinable.Translation in the Z direction can be determined and detectable as therewill be a change in the overall size of the fiducial 1418 relative tothe imaging device. Similarly, rotational degrees of freedom about the Xand Y axes can be obtained by comparing the size of the fiducial (orportions thereof. Indeed, certain sides of the fiducial 1448 will appearlarger or smaller depending upon the direction of rotation from thestarting point to the ending point. Rotation in the Z axis can bedetermined by measuring the change in position (or identifying anddetermining the path traveled) of the fiducial 1448.

In one aspect, the range of the useful measurement can be limited by thesize of the image sensor 1411. However, in another aspect, if the updaterate is sufficient with respect to the relative movement speed, then upto the entire imaging device (or the image sensor 1411) can be used asthe sensing element. This will provide extremely high resolution, aswell as provide, in some instances, a sensor with a range of motion thatis limited only by the continuity of the surface it is on (i.e., thegiven location and associated “pattern” can be the reference image for asubsequent displacement measurement). In short, the signal generated bythe imaging device 1410 can be based substantially on the fiducial 1448and the image it facilitates (it is noted that there may be some portionof the signal generated from incremental motion at the edges). Thissignal can then be processed in a similar manner as discussed herein.

Although a single fiducial 1448 is shown in the example of FIGS. 19A and19B, it is contemplated that a plurality of fiducials can be used withina single sensor to provide more complex or unique image indiciaidentifiable by the imaging device. The fiducials can be the same ordifferent in their type, characteristics, etc. as will be apparent tothose skilled in the art.

In another aspect, the sensor can comprise a fiducial capable ofluminescing or one being caused to luminesce, wherein light emitted bythe fiducial 1448 is caused to be received on the imaging device, suchthat the fiducial 1448 effectively functions in a similar manner as thededicated light sources discussed above with respect to the other sensorembodiments, and wherein relative movement within the sensor in one ormore degrees of freedom is determinable based on the light emitted bythe fiducial 1448 caused to disperse across different pixels of theimaging device 1410. In one example embodiment, the sensor 1400 canfurther comprise a light source 1462 supported by a light component1460, wherein the light source 1462 is operative to generate and directa beam of light 1464 onto the fiducial 1448 capable of causing thefiducial 1448 to emit light, such that the resulting emission isdetectable by the imaging device 1410 for the purpose of determiningrelative movement between the imaging device 1410 and the supportstructure 1440 and the fiducial 1448 thereon in one or more degrees offreedom. In this example, the fiducial 1448 can be excitable. In oneexample, the fiducial 1448 can comprise a fluorescent, wherein the lightsource 1462 operative within the sensor 1400 directs a beam of light(e.g., UV light) toward and onto the fiducial 1448 causing the fiducial1448 to fluoresce and emit light detectable by the imaging device 1410.The fiducial 1448 can be formed of a fluorescing material, or it cancomprise a fluorescing coating. The light source 1462 can be locatedabout a side of the sensor 1400 common with the imaging device 1410,such that the light source 1462 and the imaging device 1410 can bepowered from the same common side. In one aspect, the structure insupport of the light source 1462 can comprise the same structuresupporting the imaging device 1410. In another aspect, these cancomprise different structures.

In one aspect of the technology described herein, the light source 1462can comprise a UV light operative to propagate light at a wavelengthranging from approximately 315 to 400 nanometers. In another aspect, thelight source 1462 can emit UV light at wavelengths in the mid (290-315nm) or far (190-290 nm) UV fields.

Other types of luminescence methods and systems are contemplated for useon or with the fiducial, such as phosphorescence, and chemiluminescence.

FIG. 19C illustrates an alternative example of a fiducial operablewithin the sensor 1400, wherein the fiducial comprises a plurality offiducials 1548 in the form of bars disposed about the surface 1545 ofthe support structure 1540 in a specific pattern. In one aspect, thefiducials 1548 can each comprise a different dimension, such that eachof the different fiducials 1448 (and the image indicia formed by these)are individually identifiable by the imaging device 1410. In anotheraspect, a characteristic or aspect about all or a certain collection ofthe fiducials 1448 can also be identified and used in the measurements.For example, in the example shown, the slope of a line defined by theterminal ends of the various fiducials 1448 can be known and tracked.Knowing the characteristics or aspects of each individual fiducial 1448(or the characteristics or aspects of all or a collection of fiducials)being used facilitates comparison of each fiducial 1448 as a result ofrelative movement between them and the imaging device 1410, similar tohow comparison and measurement of a single fiducial is achieved asdiscussed above.

Again, the sensor 1400 can further comprise a position module and anyother components for facilitating functionality in a similar manner asdiscussed herein.

With reference to FIGS. 20A and 20B, illustrated is a sensor inaccordance with another example of the present disclosure. The sensor1600 is similar in many respects to the sensor 1400 of FIGS. 19A and19B, except that the support structure 1640 comprises or is the actualobject being sensed (or at least a portion thereof) rather than aseparate component of the sensor that is attached or otherwise supportedby the object being sensed. In addition, in one aspect, the fiducial (orfiducials) 1648 can comprise a dedicated fiducial applied to or disposedabout the surface 1645, similar to those discussed above. In anotheraspect, the fiducial 1648 can comprise one or more existing features orpart of the surface 1645 itself. Keeping in mind that in this examplethe support structure 1640 is the object being sensed, and thus thesurface 1645 comprises a surface of the object being sensed, identifyingone or more fiducials that are actually a part of the object beingsensed can facilitate functionality of the sensor 1600, particularly ifthe surface 1645 comprises various surface irregularities. In theexample shown, the surface 1645 comprises a plurality of surfaceirregularities that can be identified and used as fiducials 1648. Theimaging device 1610 having an image sensor 1611 can be supportedrelative to the support structure 1640 to be sensed (the object in thiscase, or a portion thereof), such that relative movement between theimaging device 1610 and the support structure 1640 is facilitated. Theimaging device 1610 can be placed proximate to the fiducials 1648.Measurements in the various degrees of freedom in the sensor 1600 can bedeterminable in a similar manner as discussed above with respect to thesensor of FIGS. 19A and 19B.

Again, the sensor 1400 can further comprise a position module and anyother components for facilitating functionality in a similar manner asdiscussed herein.

Similar to the example shown in FIG. 17, it is contemplated herein thata plurality of sensors like those shown in FIGS. 19A-20B with aplurality of imaging devices and fiducials can be used together toobtain images across the plurality of sensors, wherein the images can bestitched together. In one example, the plurality of imaging devices canbe arranged in a manner so as to ensure a usable signal to at least oneimaging device at any given time. In another example using a pluralityof imaging devices, respective measurements from two or more of theplurality of imaging devices can be combined to determine relativemovement.

In accordance with one embodiment of the present disclosure, a methodfor facilitating a displacement measurement is disclosed. The method cancomprise providing an imaging device operative with a support structure;facilitating association of a fiducial with the support structure,wherein the fiducial is identifiable by the imaging device; facilitatingrelative movement between the support structure and the imaging devicein at least one degree of freedom; and facilitating determination of achange in a characteristic or aspect of the fiducial relative to theimaging device upon the relative movement of the support structure andthe imaging device. Facilitating determination of a change in acharacteristic or aspect of the fiducial can comprise facilitatingdetermination of one or both of a change in a size and a change inposition of the fiducial relative to the imaging device. Facilitatingassociation of a fiducial with the support structure can comprisedisposing a fiducial on a surface of the support structure, oridentifying one or more surface irregularities in the support structureas the fiducial or fiducials, wherein the support structure comprises asurface of an object to be sensed. The method can further compriseconfiguring the fiducial to luminesce. In one example, this can comprisecoating the fiducial with a material that fluoresces (or forming thefiducial from a material that fluoresces), and subjecting the fiducialto light from a light source configured to cause the fiducial to exciteand fluoresce (emit light), wherein light emitted from the upon fiducialcan be used to determine relative movement between the imaging deviceand the support structure (and the fiducial).

It is to be understood that the embodiments of the invention disclosedare not limited to the particular structures, process steps, ormaterials disclosed herein, but are extended to equivalents thereof aswould be recognized by those ordinarily skilled in the relevant arts. Itshould also be understood that terminology employed herein is used forthe purpose of describing particular embodiments only and is notintended to be limiting.

Reference throughout this specification to “one embodiment” or “anembodiment” means that a particular feature, structure, orcharacteristic described in connection with the embodiment is includedin at least one embodiment of the present disclosure. Thus, appearancesof the phrases “in one embodiment” or “in an embodiment” in variousplaces throughout this specification are not necessarily all referringto the same embodiment.

As used herein, a plurality of items, structural elements, compositionalelements, and/or materials may be presented in a common list forconvenience. However, these lists should be construed as though eachmember of the list is individually identified as a separate and uniquemember. Thus, no individual member of such list should be construed as ade facto equivalent of any other member of the same list solely based ontheir presentation in a common group without indications to thecontrary. In addition, various embodiments and example of the presentdisclosure may be referred to herein along with alternatives for thevarious components thereof. It is understood that such embodiments,examples, and alternatives are not to be construed as de factoequivalents of one another, but are to be considered as separate andautonomous representations of the present disclosure.

Furthermore, the described features, structures, or characteristics maybe combined in any suitable manner in one or more embodiments. In thedescription, numerous specific details are provided, such as examples oflengths, widths, shapes, etc., to provide a thorough understanding ofembodiments of the invention. One skilled in the relevant art willrecognize, however, that the invention can be practiced without one ormore of the specific details, or with other methods, components,materials, etc. In other instances, well-known structures, materials, oroperations are not shown or described in detail to avoid obscuringaspects of the invention.

While the foregoing examples are illustrative of the principles of thepresent disclosure in one or more particular applications, it will beapparent to those of ordinary skill in the art that numerousmodifications in form, usage and details of implementation can be madewithout the exercise of inventive faculty, and without departing fromthe principles and concepts of the invention. Accordingly, it is notintended that the invention be limited, except as by the claims setforth below.

What is claimed is:
 1. A sensor comprising: a light component supportconfigured to mechanically couple to a surface of an object to besensed; a first light source that generates a beam of light, wherein thefirst light source is supported by the light component support; animager that receives the beam of light, and converts the beam of lightinto an electric signal; and a transparent layer disposed between theimager and the light component that elastically couples the imager tothe light component; wherein the sensor: determines a relative positionof the imager and the light component support based on the beam of lightreceived by the imager, and calculates a strain on the surface of theobject in one or more degrees of freedom based on the relative positionof the imager and the light component support.
 2. The sensor of claim 1,wherein the one or more degrees of freedom include: a relativetranslation along an x-axis, a relative translation along a y-axis, arelative rotation about the x-axis, a relative rotation about they-axis, a relative translation along a z-axis, and a relative rotationabout the z-axis; wherein the x-axis, y-axis and z-axis are orthogonal.3. The sensor of claim 2, wherein the beam of light comprises a conicalshape.
 4. The sensor of claim 2, wherein the beam of light comprises across-sectional area having a dimension in a direction of the x-axisgreater than a dimension in a direction of the y-axis.
 5. The sensor ofclaim 4, wherein the z-axis is substantially normal to the imager. 6.The sensor of claim 4, wherein the first light source generates the beamof light having an oblong cross sectional area.
 7. The sensor of claim4, wherein the first light source emits light through an aperture. 8.The sensor of claim 4, wherein the first light source is oriented on anincline relative to the imager so as to provide the beam of light withan inclined angle of incidence on the imager.
 9. The sensor of claim 8,wherein the light component support and the imager are situatedsubstantially parallel to one another, and the first light source ismounted on the light component support at an incline relative to theimager.
 10. The sensor of claim 8, wherein the light component supportand the imager are situated substantially non-parallel to one another,and the first light source is mounted on the light component support ina substantially normal orientation to the light component support. 11.The sensor of claim 4, including at least one of a lens or a collimatorthat directs the beam of light from the first light source.
 12. Thesensor of claim 1, wherein the first light source directs the beam oflight having an oblong cross section area onto the imager.
 13. Thesensor of claim 1, further comprising a plurality of light sourcesmechanically coupled to the light component support, wherein theplurality of light sources generate a plurality of beams of light, atleast some of the plurality of light sources emitting light at differentfrequencies.
 14. The sensor of claim 1, further comprising a pluralityof light sources mechanically coupled to the light component support,wherein the plurality of light sources generate a plurality of beams oflight, at least some of the plurality of light sources emitting light atdifferent frequencies, wherein the imager further receives a cumulative,interference light emission having a plurality of edges.
 15. The sensorof claim 1, wherein the imager comprises an image sensor selected fromthe group consisting of a charge-coupled device (CCD) sensor, acomplementary metal oxide semiconductor (CMOS) sensor, and a N-typemetal-oxide-semiconductor (NMOS or Live MOS) sensor.
 16. The sensoraccording to claim 1, wherein the light component support furthersupports a known mass; and the sensor further determines accelerationbased on the known mass and the relative position of the imager and thelight component support.